Title:	Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM)
Authors:	J Stokes, Debbie Mark Rainforth
Keywords:	Scanning electron microscopy
Issue Date:	2008
Publisher:	John Wiley & Sons, Ltd
Description:	Scanning electron microscopy (SEM) is a technique of major importance and is widely used throughout the scientific and technological commu- nities. The modern scanning electron microscope is capable of imaging details of the order of tens of ◦Angstroms (i.e. sub-nanometre), subject to the limits of electron–specimen interactions. However, for a long time it has been apparent that the high-vacuum SEM needed to develop in respects other than increased resolution. Hence, the advent of SEMs that utilise a gas for image formation while simultaneously provid- ing charge stabilisation for electrically nonconductive specimens. Some instruments also allow for thermodynamic stabilisation of hydrated specimens. These microscopes are known by terms such as ‘environmen- tal’, ‘extended pressure’ and ‘variable pressure’ SEM, amongst many others, depending upon manufacturer. There is ongoing discussion in the microscopy community as to adopting a generic term to encompass all of these instrument types. For the time being, I propose to use the term variable pressure-environmental SEM (VP-ESEM), with the proviso that this is merely for the sake of convenience.
URI:	http://10.6.20.12:80/handle/123456789/76401
ISBN:	978-0-470-06540-2
Appears in Collections:	Chemistry

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