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192.168.6.56/handle/123456789/76401Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | J Stokes, Debbie | - |
| dc.contributor.editor | Mark Rainforth | - |
| dc.date.accessioned | 2019-07-23T13:10:19Z | - |
| dc.date.available | 2019-07-23T13:10:19Z | - |
| dc.date.issued | 2008 | - |
| dc.identifier.isbn | 978-0-470-06540-2 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/76401 | - |
| dc.description | Scanning electron microscopy (SEM) is a technique of major importance and is widely used throughout the scientific and technological commu- nities. The modern scanning electron microscope is capable of imaging details of the order of tens of ◦Angstroms (i.e. sub-nanometre), subject to the limits of electron–specimen interactions. However, for a long time it has been apparent that the high-vacuum SEM needed to develop in respects other than increased resolution. Hence, the advent of SEMs that utilise a gas for image formation while simultaneously provid- ing charge stabilisation for electrically nonconductive specimens. Some instruments also allow for thermodynamic stabilisation of hydrated specimens. These microscopes are known by terms such as ‘environmen- tal’, ‘extended pressure’ and ‘variable pressure’ SEM, amongst many others, depending upon manufacturer. There is ongoing discussion in the microscopy community as to adopting a generic term to encompass all of these instrument types. For the time being, I propose to use the term variable pressure-environmental SEM (VP-ESEM), with the proviso that this is merely for the sake of convenience. | en |
| dc.language | en | en |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley & Sons, Ltd | en_US |
| dc.subject | Scanning electron microscopy | en_US |
| dc.title | Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM) | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Chemistry | |
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