Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/37414| Title: | Accelerated Testing Statistical Models, Test Plans, and Data Analyses |
| Authors: | Nelson, Wayne |
| Keywords: | Graphical Data Analysis |
| Issue Date: | 2004 |
| Publisher: | John Wiley & Sons, Ltd |
| URI: | http://10.6.20.12:80/handle/123456789/37414 |
| ISBN: | 0-47 1-69736-2 |
| Appears in Collections: | Statistics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Wayne Nelson_2004.pdf | 32.45 MB | Adobe PDF | View/Open |
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