Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/37414Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Nelson, Wayne | - |
| dc.date.accessioned | 2019-01-24T11:38:30Z | - |
| dc.date.available | 2019-01-24T11:38:30Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.isbn | 0-47 1-69736-2 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/37414 | - |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley & Sons, Ltd | en_US |
| dc.subject | Graphical Data Analysis | en_US |
| dc.title | Accelerated Testing Statistical Models, Test Plans, and Data Analyses | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Statistics | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Wayne Nelson_2004.pdf | 32.45 MB | Adobe PDF | View/Open |
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