Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/88559| Title: | Scanning Electron Microscopy and X-Ray Microanalysis |
| Authors: | Joseph I. GoldsteinDale E. NewburyJoseph R. MichaelNicholas W.M. RitchieJohn Henry J. ScottDavid C. Joy |
| Issue Date: | 10-Jan-2018 |
| Publisher: | Springer |
| URI: | http://196.189.45.87:8080/handle/123456789/88559 |
| Appears in Collections: | Chemistry |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2018_Book_ScanningElectronMicroscopyAndX.pdf | 60.75 MB | Adobe PDF | View/Open |
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