Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/88559Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Joseph I. GoldsteinDale E. NewburyJoseph R. MichaelNicholas W.M. RitchieJohn Henry J. ScottDavid C. Joy | - |
| dc.date.accessioned | 2020-05-25T10:40:46Z | - |
| dc.date.available | 2020-05-25T10:40:46Z | - |
| dc.date.issued | 2018-01-10 | - |
| dc.identifier.uri | http://196.189.45.87:8080/handle/123456789/88559 | - |
| dc.language | en | en |
| dc.publisher | Springer | en_US |
| dc.title | Scanning Electron Microscopy and X-Ray Microanalysis | en_US |
| dc.type | Book | en |
| Appears in Collections: | Chemistry | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2018_Book_ScanningElectronMicroscopyAndX.pdf | 60.75 MB | Adobe PDF | View/Open |
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