Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/77190
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.editor | Miczo, Alexander | - |
dc.date.accessioned | 2019-07-30T05:50:39Z | - |
dc.date.available | 2019-07-30T05:50:39Z | - |
dc.date.issued | 2003 | - |
dc.identifier.isbn | 0-471-43995-9 | - |
dc.identifier.uri | http://10.6.20.12:80/handle/123456789/77190 | - |
dc.language.iso | en | en_US |
dc.publisher | John Wiley & Sons, Inc | en_US |
dc.subject | Digital electronics—Testing | en_US |
dc.title | Digital Logic Testing and Simulation | en_US |
dc.type | Book | en_US |
Appears in Collections: | Mathematics |
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