Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/77051
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Finkelstein, Maxim | - |
dc.contributor.author | Cha, Ji Hwan | - |
dc.date.accessioned | 2019-07-26T07:43:48Z | - |
dc.date.available | 2019-07-26T07:43:48Z | - |
dc.date.issued | 2013 | - |
dc.identifier.isbn | 978-1-4471-5028-2 | - |
dc.identifier.uri | http://10.6.20.12:80/handle/123456789/77051 | - |
dc.language.iso | en | en_US |
dc.publisher | Springer | en_US |
dc.subject | Stochastic Modeling for Reliability | en_US |
dc.title | Stochastic Modeling for Reliability | en_US |
dc.title.alternative | Shocks, Burn-in and Heterogeneous Populations | en_US |
dc.type | Book | en_US |
Appears in Collections: | Electrical and Computer Engineering |
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