Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/76942
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Egerton, Ray F. | - |
dc.date.accessioned | 2019-07-25T11:32:21Z | - |
dc.date.available | 2019-07-25T11:32:21Z | - |
dc.date.issued | 2005 | - |
dc.identifier.isbn | 978-0387-25800-0 | - |
dc.identifier.uri | http://10.6.20.12:80/handle/123456789/76942 | - |
dc.language | en | en |
dc.language.iso | en | en_US |
dc.publisher | Springer | en_US |
dc.subject | Physical Principles of Electron Microscopy | en_US |
dc.title | Physical Principles of Electron Microscopy | en_US |
dc.type | Book | en_US |
Appears in Collections: | Chemistry |
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