Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/76937
Title: Aberration-Corrected Analytical Transmission Electron Microscopy
Authors: Brydson, Rik
Keywords: Aberration-Corrected Analytical Transmission Electron Microscopy
Issue Date: 2011
Publisher: John Wiley & Sons, Ltd
Description: Electron Microscopy, very much the imaging tool of the 20th Century, has undergone a steep change in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both probe-forming and image-forming electron lenses. This book aims to review this exciting new area of 21st Century analytical science which can now allow true imaging and chemical analysis at the scale of single atoms.
URI: http://10.6.20.12:80/handle/123456789/76937
ISBN: 978-0-470-51851-9
Appears in Collections:Chemistry

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