Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/76937
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dc.contributor.editorBrydson, Rik-
dc.date.accessioned2019-07-25T11:15:03Z-
dc.date.available2019-07-25T11:15:03Z-
dc.date.issued2011-
dc.identifier.isbn978-0-470-51851-9-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/76937-
dc.descriptionElectron Microscopy, very much the imaging tool of the 20th Century, has undergone a steep change in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both probe-forming and image-forming electron lenses. This book aims to review this exciting new area of 21st Century analytical science which can now allow true imaging and chemical analysis at the scale of single atoms.en
dc.languageenen
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons, Ltden_US
dc.subjectAberration-Corrected Analytical Transmission Electron Microscopyen_US
dc.titleAberration-Corrected Analytical Transmission Electron Microscopyen_US
dc.typeBooken_US
Appears in Collections:Chemistry

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