Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/76420
Title: High-Resolution Electron Microscopy
Authors: Spence, John C. H.
Keywords: High-Resolution Electron Microscopy
Issue Date: 2013
Publisher: Oxford
Description: The history of science can be viewed as progress in our efforts to measure things—as Kelvin commented: ‘Unless you can measure it, you cannot improve it’. And so it has been in the recent history of high-resolution electron microscopy, whether in structural biology, in the analytical and imaging modes of the scanning transmission (STEM), or the full-field transmission electron microscope (TEM). The decade since the last edition of this book has been characterized more than in any other way by advances in the accurate quantification of the various signals from these instruments, advances in the power and speed of computer algorithms for simulating them, and the drive toward three-dimensional imaging at atomic resolution. This drive to quantify imaging and spectroscopic signals, partly due to improved computers and detectors, has finally moved us from the realm of the physicists to the level of specialists in materials science and structural biology. At the same time, the entire agenda of modern science which is relevant to microscopy has shifted since the first edition of this book over 30 years ago, for example toward nanoscience, rather than the study of defects in bulk materials, toward a more quantitative biophysics, and toward protein dynamics, in addition to structure. A wide range of competing new microscopies has also developed in this period, as reviewed in the two volumes of Science of Microscopy edited by P. Hawkes and J. C. H. Spence (Springer, 2006).
URI: http://10.6.20.12:80/handle/123456789/76420
ISBN: 978–0–19–966863–2
Appears in Collections:Chemistry

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