Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/66170
Title: Process Variations and Probabilistic Integrated Circuit Design
Authors: Dietrich, Manfred
Issue Date: 2012
Publisher: Springer Science+Business Media, LLC
URI: http://10.6.20.12:80/handle/123456789/66170
ISBN: 978-1-4419-6620-9
Appears in Collections:Electrical and Computer Engineering

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