Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/65017
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dc.contributor.authorMahapatra, Souvik-
dc.date.accessioned2019-04-25T07:09:44Z-
dc.date.available2019-04-25T07:09:44Z-
dc.date.issued2016-
dc.identifier.isbn978-81-322-2507-2-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/65017-
dc.language.isoenen_US
dc.publisherSpringer Indiaen_US
dc.titleFundamentals of Bias Temperature Instability in MOS Transistorsen_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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