Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/58036
Title: | Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices |
Authors: | Sikula, Josef |
Keywords: | noise sources, 1/f noise, fluctuation in the mobility, number fluctuations |
Issue Date: | 2004 |
Publisher: | Kluwer Academic Publishers |
URI: | http://10.6.20.12:80/handle/123456789/58036 |
ISBN: | 1-4020-2170-4 |
Appears in Collections: | Physics |
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