Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/58036
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dc.contributor.editorSikula, Josef-
dc.date.accessioned2019-03-26T08:52:45Z-
dc.date.available2019-03-26T08:52:45Z-
dc.date.issued2004-
dc.identifier.isbn1-4020-2170-4-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/58036-
dc.language.isoenen_US
dc.publisherKluwer Academic Publishersen_US
dc.subjectnoise sources, 1/f noise, fluctuation in the mobility, number fluctuationsen_US
dc.titleAdvanced Experimental Methods for Noise Research in Nanoscale Electronic Devicesen_US
dc.typeBooken_US
Appears in Collections:Physics

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