Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/58036
Title: Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
Authors: Sikula, Josef
Keywords: noise sources, 1/f noise, fluctuation in the mobility, number fluctuations
Issue Date: 2004
Publisher: Kluwer Academic Publishers
URI: http://10.6.20.12:80/handle/123456789/58036
ISBN: 1-4020-2170-4
Appears in Collections:Physics

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