Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/57584
Title: DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition
Authors: Mano, Sachdev
Issue Date: 2007
Publisher: Springer
URI: http://10.6.20.12:80/handle/123456789/57584
ISBN: 10 0-387-46546-4
Appears in Collections:Electrical and Computer Engineering

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