Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/57584
Title: | DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS 2nd Edition |
Authors: | Mano, Sachdev |
Issue Date: | 2007 |
Publisher: | Springer |
URI: | http://10.6.20.12:80/handle/123456789/57584 |
ISBN: | 10 0-387-46546-4 |
Appears in Collections: | Electrical and Computer Engineering |
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