Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/57431
Title: DATA MINING AND DIAGNOSING IC FAILS
Authors: LEENDERT, M. HUISMAN
Issue Date: 2005
Publisher: Springer
URI: http://10.6.20.12:80/handle/123456789/57431
ISBN: 0-387-24993-1
Appears in Collections:Electrical and Computer Engineering

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