Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/12597
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dc.contributor.authorGao, Jianjun-
dc.date.accessioned2018-10-19T11:06:50Z-
dc.date.available2018-10-19T11:06:50Z-
dc.date.issued2010-
dc.identifier.isbn978-1-891121-89-0-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/12597-
dc.language.isoenen_US
dc.publisherSciTech Publishing, Raleigh, NC.en_US
dc.subjectField-effect transistorsen_US
dc.subjectCompound semiconductorsen_US
dc.title"RF and microwave modeling and measurement techniques for field effect transistors"en_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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