Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/11633Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.editor | M. UDA | - |
| dc.contributor.editor | G., Demortier | - |
| dc.contributor.editor | I. NAKA | - |
| dc.date.accessioned | 2018-10-18T05:50:56Z | - |
| dc.date.available | 2018-10-18T05:50:56Z | - |
| dc.date.issued | 2005 | - |
| dc.identifier.isbn | 978-1-4020-3581-4 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/11633 | - |
| dc.description | X-ray fluorescence (XRF) and particle induced X-ray emission (PIXE), and X-ray diffraction (XRD) methods have been used extensively to study the chemical compositions and crystal structures of monuments, respectively, especially to characterize pigments used in ancient Egypt. Recent investigations of ancient Egyptian pigments by these methods are reviewed here. | - |
| dc.language | en | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Springer | en_US |
| dc.subject | X-rays for Archaeology | en_US |
| dc.title | X-rays for Archaeology | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Archeology and Heritage Management | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 33.pdf.pdf | 13.62 MB | Adobe PDF | View/Open |
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