Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/10607
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dc.contributor.authorGray, Kirk-
dc.contributor.authorJames, John-
dc.date.accessioned2018-10-15T10:45:15Z-
dc.date.available2018-10-15T10:45:15Z-
dc.date.issued2016-
dc.identifier.isbn978-1118700235-
dc.identifier.isbn299en_US
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/10607-
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons, Ltden_US
dc.subjectAccelerated life testingen_US
dc.titleNext generation HALT and HASS : robust design of electronics and systemsen_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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