Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/10607
Title: Next generation HALT and HASS : robust design of electronics and systems
Authors: Gray, Kirk
James, John
Keywords: Accelerated life testing
Issue Date: 2016
Publisher: John Wiley & Sons, Ltd
URI: http://10.6.20.12:80/handle/123456789/10607
ISBN: 978-1118700235
299
Appears in Collections:Electrical and Computer Engineering

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