Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/77111
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dc.contributor.authorEchlin, Patrick-
dc.date.accessioned2019-07-26T08:37:40Z-
dc.date.available2019-07-26T08:37:40Z-
dc.date.issued2009-
dc.identifier.isbn978-0-387-85731-2-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/77111-
dc.languageenen
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectScanning Electron Microscopy and X-Ray Microanalysisen_US
dc.titleHandbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisen_US
dc.typeHandbooken_US
Appears in Collections:Chemistry

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