Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/76925
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dc.contributor.authorReed, S. J. B.-
dc.date.accessioned2019-07-25T10:35:49Z-
dc.date.available2019-07-25T10:35:49Z-
dc.date.issued2005-
dc.identifier.isbn978-0-511-12542-3-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/76925-
dc.descriptionThis book describes electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. No prior knowledge is assumed and unnecessary technical detail is avoided, in order to keep the book easily accessible to new users of these techniques.en
dc.languageenen
dc.language.isoenen_US
dc.publisherCambridgeen_US
dc.subjectElectron Microprobe Analysis and Scanning Electron Microscopy in Geologyen_US
dc.titleElectron Microprobe Analysis and Scanning Electron Microscopy in Geologyen_US
dc.typeBooken_US
Appears in Collections:Chemistry

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