Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/76211
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dc.contributor.editorPark, Byung-Eun-
dc.date.accessioned2019-07-23T06:35:40Z-
dc.date.available2019-07-23T06:35:40Z-
dc.date.issued2016-
dc.identifier.isbn978-94-024-0841-6-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/76211-
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectFerroelectric-Gateen_US
dc.titleFerroelectric-Gate Field Effect Transistor Memoriesen_US
dc.typeBooken_US
Appears in Collections:Physics

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