Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/69921Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Schooten, Kipp van | - |
| dc.date.accessioned | 2019-05-30T06:16:47Z | - |
| dc.date.available | 2019-05-30T06:16:47Z | - |
| dc.date.issued | 2013 | - |
| dc.identifier.isbn | 978-3-319-00590-4 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/69921 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Springer | en_US |
| dc.subject | Traps and Chemical | en_US |
| dc.title | Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Physics | |
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