Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/42617
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dc.contributor.editorHelms, C. Robert-
dc.contributor.editorDeal, Bruce E.-
dc.date.accessioned2019-02-11T12:09:45Z-
dc.date.available2019-02-11T12:09:45Z-
dc.date.issued1993-
dc.identifier.isbn978-1-4899-1588-7-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/42617-
dc.language.isoenen_US
dc.publisherSpringer Scienceen_US
dc.subjectthe SiOz film and the Si-Si02 interfaceen_US
dc.titleThe Physics and Chetnistry of Si02 and the Si-Si02 Interface 2en_US
dc.typeBooken_US
Appears in Collections:Chemistry

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