Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/39791Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | B. Schaub, Keith | - |
| dc.contributor.author | Kelly, Joe | - |
| dc.date.accessioned | 2019-02-03T15:27:26Z | - |
| dc.date.available | 2019-02-03T15:27:26Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.isbn | 1-58053-692-1 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/39791 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Artech House | en_US |
| dc.subject | Semiconductors—Testing | en_US |
| dc.title | Production Testing of RF and System-on-a-Chip Devices for Wireless Communications | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Information and Computer Science | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 11.pdf.pdf | 3.37 MB | Adobe PDF | View/Open |
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