Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/31492
Title: CMOS RF Circuit Design for Reliability and Variability
Authors: Yuan, Jiann-Shiun
Keywords: Electronic circuits
Microwaves
Issue Date: 2016
Publisher: SpringerBriefs
URI: http://10.6.20.12:80/handle/123456789/31492
ISBN: 978-981-10-0884-9
Appears in Collections:Electrical and Computer Engineering

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