Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/27772
Title: Nanometer Technology Designs High-Quality Delay Tests
Authors: Tehranipoor, Mohammad
Ahmed, Nisar
Keywords: Technology Designs
High Quality Delay Tests
Issue Date: 2008
Publisher: Springer Science+Business Media, LLC
URI: http://10.6.20.12:80/handle/123456789/27772
ISBN: 978-0-387-76486-3
287
Appears in Collections:Electrical and Computer Engineering

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