Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/21683
Title: Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits
Authors: Sachdev, Manoj
Keywords: Cmos Vlsi Circuits
Issue Date: 2007
Publisher: New York
URI: http://10.6.20.12:80/handle/123456789/21683
ISBN: 10 0-387-46546-4
Appears in Collections:Medicine

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