Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/13354
Title: Examining the Submicron World
Authors: Feder, Ralph
Keywords: Electron microscopy ; 2. X-ray
Issue Date: 1986
Publisher: Plenum Press
URI: http://10.6.20.12:80/handle/123456789/13354
ISBN: 978-1-4612-9297-5
Appears in Collections:Biology

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