Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/12249
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Schaub, Keith B | - |
dc.date.accessioned | 2018-10-19T06:01:54Z | - |
dc.date.available | 2018-10-19T06:01:54Z | - |
dc.date.issued | 2004 | - |
dc.identifier.isbn | 1-58053-692-1 | - |
dc.identifier.uri | http://10.6.20.12:80/handle/123456789/12249 | - |
dc.language.iso | en | en_US |
dc.publisher | Artech House | en_US |
dc.subject | Semiconductors Testing | en_US |
dc.title | Production testing of RF and system-on-a-chip devices for wireless communications | en_US |
dc.type | Book | en_US |
Appears in Collections: | Electrical and Computer Engineering |
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